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  4. Bestimmung des E-Moduls dünner Schichten mit Ultraschalloberflächenwellen
 
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1994
Conference Paper
Title

Bestimmung des E-Moduls dünner Schichten mit Ultraschalloberflächenwellen

Other Title
Determination of Young's modulus of thin films by ultrasonic surface waves
Abstract
A method has been developed to determine YOUNG'S modulus and thickness of thin surface layers by measuring the phase velocity of ultrasonic surface waves. These are thermoelastically induced by a short laser pulse. From the received pulse form in dependence on measuring distance, the phase velocity is determined over a sufficient wide frequency range by a special measuring and computational procedure. By comparing experimental and theoretical dispersion curves, YOUNG'S modulus and/or the thickness can be obtained without any calibration. The potential of this nondestructive method has been demonstrated for amorphous carbon films of less than 1 micrometer thickness, prepared by vacuum arc deposition. It has been found that the elastic constants responds sensitively to variation of preparation conditions. The ultrasonic method turned out to be a suitable means for characterizing thin films.
Author(s)
Schneider, D.
Schultrich, B.
Scheibe, H.J.
Mainwork
Thin Films. Proceedings of the joint 4th International Symposium on Trends and New Applications in Thin Films TATF '94 and the 11th Conference on High Vacuum, Interfaces and Thin Films HVITF '94  
Conference
International Symposium on Trends and New Applications in Thin Films (TATF) 1994  
Conference on High Vacuum, Interfaces and Thin Films (HVITF) 1994  
Language
German
Fraunhofer-Institut für Werkstoff- und Strahltechnik IWS  
Keyword(s)
  • amorphe Kohlenstoffschicht

  • amorphous carbon film

  • E-Modul

  • film thickness

  • measurement method

  • measurement procedure

  • Meßmethode

  • Meßregime

  • Schichtdicke

  • Ultraschalloberflächenwelle

  • ultrasonic surface wave

  • Young's modulus

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