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Band offsets in Eu-containing lead chalcogenides and lead chalcogenide superlattices from spectroscopic data

Ermittlung von Band-Offsets aus spektroskopischen Daten in Eu enthaltenen Bleichalkogeniden und Bleichalkogenid-Supergittern
: Herrmann, K.H.; Auth, J.; Möllmann, K.-P.; Tomm, J.W.; Böttner, H.; Lambrecht, A.; Tacke, M.; Kolesnikov, I.V.; Yunovich, A.E.; Fedorenko, A.I.; Mironov, O.A.; Sipatov, A.Y.


Semiconductor Science and Technology 8 (1993), pp.176-179 : Abb.,Tab.,Lit.
ISSN: 0268-1242
ISSN: 1361-6641
Journal Article
Fraunhofer IPM ()
band-offset; IV-VI compound; IV-VI-Verbindung; Supergitter; superlattice

The results of an experimental study of the optical and photoelectrical properties of Eu-containing lead chalcogenides and superlattices are presented. From both sets of experiments band offset data for the lead chalcogenide europium chalcogenide heterojunction are derived. The results are compared with the data obtained from a linear interpolation of the band structures between those of the binaries.