Publica
Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten. Atomic force microscopy on cross-section of optimal coatings: a new method
Abstract
Two methods are described of preparing and investigating cross-sections of single layer and multilayer optical coatings by atomic force microscopy (AFM). The first consists of mechanical grinding and polishing followed by a final ion-polishing and etching procedure. The second is simply mechanically fracturing. The results obtained from both preparation methods are compared. In addition, cross-sectional transmission electron microscopy has been used to verify the AFM results.