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Applied pattern recognition in senor systems for quality control and automated production systems

 
: Warnecke, H.-J.; Melchior, K.; Ahlers, R.-J.; Schreiber, L.; Schraft, R.D.

Japan Society of Precision Engineering -JSPE-, Tokyo:
Utilization of artificial intelligence and pattern recognition techniques in manufacturing engineering
Tokyo, 1984
pp.163-169 : Abb.,Lit.
International Seminar on Manufacturing Systems <16, 1984, Tokyo>
English
Conference Paper
Fraunhofer IPA ()

: http://publica.fraunhofer.de/documents/PX-4443.html