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Apparatus for measuring integrated light scattering of optical components over an extended range of wavelengths

	France, C.; Gee, A.E.: Specification, production, and testing of optical components and systems Bellingham, Wash.: SPIE, 1996 (Europto series) ISBN: 0-8194-2160-X pp.297-304
	International Symposium on Optical Systems and Production <1996, Glasgow>

	English
	Conference Paper
	Fraunhofer IOF ()
	Lichtstreuung; light scattering; Oberflächenrauheit; optical characterization; optische Charakterisierung; surface roughness

Abstract
A total integrated scattering (TIS) measurement set-up is described which enables the detection of scattered light within a spatial frequency range from 0.0041 mu m(-1) to 4 mu m(-1). The apparatus is based on a Coblentz sphere and is equipped with light sources in the wavelength range from the UV to IR (248 nm - 10.6 mu m). Exemples are presented of measurements on samples with rms-roughness from angstroms to microns.

: http://publica.fraunhofer.de/documents/PX-4298.html