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Zerstörungsfreie und berührungslose Charakterisierung von Schichten mit Hilfe von Mikrowellen

: Sklarczyk, C.

Galvanotechnik 89 (1998), No.8, pp.2542-2548
ISSN: 0016-4232
Journal Article
Fraunhofer IZFP ()
coating thickness; microwave; Mikrowelle; Mikrowellenverfahren; nondestructive testing; Schicht; zerstörungsfreie Prüfung

By processing the reflected and transmitted components of radiated microwaves, coatings on a range of substrates can be characterised. The method is specially well-suited to on-line process control. In addition to yielding coating thickness data, information on, for example, dielectric properties can also be obtained of a more general characterisation of the coatings is possible. In addition to a straightforward description of coating thickness measurement, an example is quoted for zirconia coatings on steel for which coating thickness varations are demonstrated