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  4. Zerstörungsfreie und berührungslose Charakterisierung von Schichten mit Hilfe von Mikrowellen
 
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1998
Journal Article
Title

Zerstörungsfreie und berührungslose Charakterisierung von Schichten mit Hilfe von Mikrowellen

Abstract
By processing the reflected and transmitted components of radiated microwaves, coatings on a range of substrates can be characterised. The method is specially well-suited to on-line process control. In addition to yielding coating thickness data, information on, for example, dielectric properties can also be obtained of a more general characterisation of the coatings is possible. In addition to a straightforward description of coating thickness measurement, an example is quoted for zirconia coatings on steel for which coating thickness varations are demonstrated
Author(s)
Sklarczyk, C.
Journal
Galvanotechnik  
Language
German
Fraunhofer-Institut für Zerstörungsfreie Prüfverfahren IZFP  
Keyword(s)
  • coating thickness

  • microwave

  • Mikrowelle

  • Mikrowellenverfahren

  • nondestructive testing

  • Schicht

  • zerstörungsfreie Prüfung

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