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1995
Conference Paper
Titel
XPS studies of thin polycyanurate films on silicon wafers and aluminium substrates
Abstract
The fundamental understanding of the chemical and physical phenomena of the adhesion at substrate/polymer interfaces is of great importance in order to be able to solve and control adhesion problems. We used a prepolymer of the diandicyante of bisphenol A (DCBA) as a model of a network polymer. The adsorption of thin DCBA-prepolymer films on silicon and aluminium substrates is studied by x-ray photoelectron spectroscopy (XPS), infrared spectrscopy (IR) and ellipsometry.