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XPS studies of thin polycyanurate films on silicon wafers and aluminium substrates


Oechsner, H.:
8. Arbeitstagung Angewandte Oberflächenanalytik 1994. Tagungsband
Berlin: Springer, 1995 (Fresenius' journal of analytical chemistry 353)
Arbeitstagung Angewandte Oberflächenanalytik (AOFA) <8, 1994, Kaiserslautern>
Conference Paper
Fraunhofer IFAM ()
Fraunhofer IZM, Einrichtung Polymermaterialien und Composite ( Fraunhofer EPC) ()
adhesion; adsorption; polycyanurate; prepolymer; thin films; XPS

The fundamental understanding of the chemical and physical phenomena of the adhesion at substrate/polymer interfaces is of great importance in order to be able to solve and control adhesion problems. We used a prepolymer of the diandicyante of bisphenol A (DCBA) as a model of a network polymer. The adsorption of thin DCBA-prepolymer films on silicon and aluminium substrates is studied by x-ray photoelectron spectroscopy (XPS), infrared spectrscopy (IR) and ellipsometry.