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Vision integrated optoelectronic coordinate measurement

: Ahlers, R.-J.; Rauh, W.; Schreiber, L.

Chen, M.J.W.; Ahlers, R.-J. ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.:
Automated inspection and high speed vision architectures
Bellingham/Wash., 1987 (Proceedings of SPIE 849)
pp.232-235 : Abb.,Lit.
Conference on Advances in Intelligent Robotics Systems <1987, Cambridge/Mass.>
Conference Paper
Fraunhofer IPA ()
Bildverarbeitung; image processing; Koordinatenmeßtechnik(optisch); optical coordinate measurement systems

A new concept will be presented that makes use of a standard coordinate measurement system. An image processing unit is integrated to reach for high precision measurement. The mechanical displacement system gives rise to the big measurement range while the image processing system enables the measurement of complex workpieces with high precision. Two different realizations emphasize the advantageous features of this concept. They also show the influence of the different elements to reach for problem adapted systems with high performance. (IPA)