Publica
Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten. Angular dispersion of raman intensities in silicon
| 12th International Conference on Raman Spectroscopy '90. Proceedings
Chichester: Wiley and Sons, 1990
ISBN: 0-471-92785-6 |
| International Conference on Raman Spectroscopy <12, 1990, Columbia/S.C.> |
|
| English |
| Conference Paper |
| Fraunhofer IFT; 2000 dem IZM eingegliedert |
| orientation; raman silicon anisotropy |
Abstract
The Raman intensity of silicon is dependent on the crystal orientation of the probe. The angular dispersion is verified experimentally.