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Verfahren und Schaltungsanordnung zur Pruefung der Funktion einer Schalteinrichtung

Process and circuit arrangement for testing the function of a circuit device
 

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Frontpage ()

DE 1991-4112625 A: 19910418
DE 1991-4112625 A: 19910418
DE 4112625 C2: 19930513
G01R0031
German
Patent, Electronic Publication
Fraunhofer IMS ()

Abstract
The invention relates to a process and a circuit arrangement for the testing of the function of a switching device. According to the invention, a solenoid controllable for test purposes is allocated to a magnetic field sensor and a magnetic field acting on the sensor can be compensated by the said solenoid. In the initially present magnetic field operating the switching device, a resetting of the switching device to the state corresponding to the absence of a magnetic field at the sensor is caused by exciting the solenoid.

: http://publica.fraunhofer.de/documents/PX-38479.html