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1993
Conference Paper
Titel
Verfahren der Konturanalyse zur automatisierten Sichtprüfung
Abstract
The visual inspection of many industrial products is based on contour analysis. The automated visual inspection for defects like cracks and chips requires robust and flexible systems and algorithms. This paper describes new contour analysis algorithms like scalespace filtering for defect detection. The performance of different approaches is shown by several examples.
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