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Analyse von Spin-offs der Raumfahrtforschung mit Hilfe von Patentindikatoren

 
: Schmoch, U.

Weyer, J.:
Technische Visionen - politische Kompromisse. Geschichte und Perspektiven der deutschen Raumfahrt
Berlin: Edition Sigma, 1993
pp.255-313
German
Book Article
Fraunhofer ISI ()
patent analysis; patent citation; Patentanalyse; Patentzitat; Raumfahrt; space research; spin-off

Abstract
Life-Cycle-Analysis requires the analysis of the vertual process chain from the mining of a raw material to the deposition of the final product as well as the analysis of the horizontal process chains in order to consider more than the direkt environmental impacts only. The paper demonstrates that an input-output analysis augmented with branch specific emission coefficients can improve the data base of life-cycle-analysis. A combination of both methods seems to be the best way to perform life-cycle-analysis with the input-output analysis dealing with the effects otherwise neglected.

: http://publica.fraunhofer.de/documents/PX-3785.html