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Thermomechanical behaviour of chipcard materials

 
: Michel, B.; Schubert, A.; Winkler, T.

Saarton, L.A.; Zeedijk, H.B. ; Federation of European Materials Societies; Netherlands Society for Materials Science:
Materials, functionality & design. Proceedings of the 5th European Conference on Advanced Materials and Processes and Applications. Vol. 4: Characterization and production/design : EUROMAT 97, Maastricht, NL, 21 - 23 April 1997
Zwijndrecht: Netherlands Society for Materials Science, 1997
ISBN: 90-803513-4-2
pp.423-425
European Conference on Advanced Materials and Processes and Applications (EUROMAT) <5, 1997, Maastricht>
English
Conference Paper
Fraunhofer IZM ()

Abstract
Mechanical reliability issues of modern electronic packaging materials have become of great importance in microtechnologies e.g. in microelectronics and microsystem technology. Mechanical and thermal stresses are one major concern that may cause reliability problems in chipcard packages, too. Chipcards consist of various materials which are combined around the chip-board interconnection area. The paper presents numerical simulation combined with experimental investigation on chipcard modules embedded in card pockets having silicon, FR-4 as board substrate, soft solder bumps and a thin metal layer as contact plate under thermo cycle test conditions.

: http://publica.fraunhofer.de/documents/PX-36453.html