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Temperature resolved X-ray diffraction as a tool of thermal analysis

 
: Engel, W.; Eisenreich, N.; Herrmann, M.; Kolarik, V.

:

Journal of thermal analysis 49 (1997), No.2, pp.1025-1037
ISSN: 0368-4466
English
Journal Article
Fraunhofer ICT ()

Abstract
Time and temp. resolved X-ray diffraction was used for thermal anal. Series of diffraction patterns were measured, while the samples are heated/cooled stepwise or isothermally with freely selectable temp. programs. The method was applied for the investigation of the phase transitions of ammonium nitrate and HMX (1,3,5,7-tetranitro-1,3,5,7- tetraaza-cyclooctane), when the identification of phases was required. Its capability in the field of kinetics is demonstrated with the isothermal investigation of the solid state reaction of ammonium nitrate with copper oxide and the non-isothermal investigation of the high temp. corrosion of nickel, which was performed by means of a difference procedure. For obtaining structural details peak fitting and Rietveld refinement were applied for the investigation of ammonium nitrate and HMX.

: http://publica.fraunhofer.de/documents/PX-36152.html