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Study of the ambipolar carrier expansion in silicon by an optical time-of-flight method
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1984
Book Article
Title
Study of the ambipolar carrier expansion in silicon by an optical time-of-flight method
Author(s)
Axmann, A.
Laurich, B.
Forchel, A.
Hillmer, H.
Hoai, T.X.
Mainwork
Proceedings of the International Conference on Luminescence, Madison
Language
English
Fraunhofer-Institut für Angewandte Festkörperphysik IAF
Keyword(s)
ambipolare Trägerausbreitung
Flugzeitmessung