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Stress analysis using an area detector

 
: Schubert, A.; Michel, B.; Kämpfe, B.

Cernik, R.J.:
European Powder Diffraction. Proceedings of the Fourth European Powder Diffraction Conference 1995. Pt.1
Zürich-Uetikon: Trans Tech Publications, 1996 (Materials science forum 228/231)
ISBN: 0-87849-742-0
pp.125-130
European Powder Diffraction Conference (EPDIC) <4, 1995, Chester>
English
Conference Paper
Fraunhofer IZM ()
elastic deformation; internal stress; laser beam applications; steel; stress analysis; stress measurement; texture; x-ray diffraction; x-ray topography

Abstract
A new X-ray method for stress analysis is described. For data collection a two-dimensional detector like an imaging plate was used. Laser stimulated fluorescence imaging plates are available for a couple of years now and were used mainly in single crystal analysis. In contrast to normal counters a good resolution in both counter directions is given and should be used for stress analysis.

: http://publica.fraunhofer.de/documents/PX-35042.html