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  4. Stress analysis using an area detector
 
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1996
Conference Paper
Title

Stress analysis using an area detector

Abstract
A new X-ray method for stress analysis is described. For data collection a two-dimensional detector like an imaging plate was used. Laser stimulated fluorescence imaging plates are available for a couple of years now and were used mainly in single crystal analysis. In contrast to normal counters a good resolution in both counter directions is given and should be used for stress analysis.
Author(s)
Schubert, A.
Michel, B.
Kämpfe, B.
Mainwork
European Powder Diffraction. Proceedings of the Fourth European Powder Diffraction Conference 1995. Pt.1  
Conference
European Powder Diffraction Conference (EPDIC) 1995  
Language
English
Fraunhofer-Institut für Zuverlässigkeit und Mikrointegration IZM  
Keyword(s)
  • elastic deformation

  • internal stress

  • laser beam applications

  • steel

  • stress analysis

  • stress measurement

  • texture

  • x-ray diffraction

  • x-ray topography

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