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AFM helps engineer low-scatter thin films

	Laser focus world 34 (1998), No.4, pp.147-152 ISSN: 0740-2511 ISSN: 1043-8092

	English
	Journal Article
	Fraunhofer IOF ()
	atomic force microscopy; light scattering; microstructure; optical loss; surface roughness; thin film; UV coating

Abstract
The paper dicusses several aspects of thin-film and substrate surface microstructures as they relate to scatter losses. Surface roughness and scatter are related through Power Spectral Density analysis of AFM roughness data. A practical way is shown how to predict scatter effects when PSD curves are known.

: http://publica.fraunhofer.de/documents/PX-3424.html