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Soft-X-ray diagnostics of a nitrogen pinchplasma source for imaging X-ray microscopy

: Holz, R.; Rothweiler, D.; Neff, W.; Lebert, R.

	Istituto di fisica Atomica e Molecolare, Pisa: 20th International Conference on Phenomena in Ionized Gases '91. Contributed papers 3 Pisa, 1991 pp.827-828 : Abb.,Lit.
	International Conference on Phenomena in Ionized Gases <20, 1991, Pisa>

	English
	Conference Paper
	Fraunhofer ILT ()
	emission; gas; measurement; nitrogen; parameter; pinch plasma; plasma; spectroscopy; x-ray

Abstract
Pinch plasmas are sources of high brilliance for soft x-rays in the wavelength range from Lambda is equal to 0.1 nm to 20 nm. A plasma focus device emitting line radiation of hydrogen-like nitrogen at Lambda is equal to 2.5 nm into the water window region has been developed as a source for a laboratory imaging x-ray microscope. Several diagnostic methods as transmission gratings, zone plate optics and x-ray streak camera are applied to measure and maximize the brilliance of the line emission of the source.