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  4. Soft-X-ray diagnostics of a nitrogen pinchplasma source for imaging X-ray microscopy
 
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1991
Conference Paper
Title

Soft-X-ray diagnostics of a nitrogen pinchplasma source for imaging X-ray microscopy

Abstract
Pinch plasmas are sources of high brilliance for soft x-rays in the wavelength range from Lambda is equal to 0.1 nm to 20 nm. A plasma focus device emitting line radiation of hydrogen-like nitrogen at Lambda is equal to 2.5 nm into the water window region has been developed as a source for a laboratory imaging x-ray microscope. Several diagnostic methods as transmission gratings, zone plate optics and x-ray streak camera are applied to measure and maximize the brilliance of the line emission of the source.
Author(s)
Holz, R.
Rothweiler, D.
Neff, W.
Lebert, R.
Mainwork
20th International Conference on Phenomena in Ionized Gases '91. Contributed papers 3  
Conference
International Conference on Phenomena in Ionized Gases 1991  
Language
English
Fraunhofer-Institut für Lasertechnik ILT  
Keyword(s)
  • emission

  • gas

  • measurement

  • nitrogen

  • parameter

  • pinch plasma

  • plasma

  • spectroscopy

  • x-ray

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