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SCHALTUNG UND VERFAHREN ZUM MESSEN EINER DIE KAPAZITAETS-SPANNUNGS-CHARAKTERISTIK EINES KAPAZITIVEN ELEMENTES BEEINFLUSSENDEN GROESSE

Circuit and process for measuring a parameter influencing the capacitance-voltage characteristic of a capacitive component
 
: Schoeneberg, U.; Hosticka, B.; Maclay, J.; Zimmer, G.

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Frontpage ()

DE 1989-3915563 A: 19890512
DE 1990-4014395 A: 19900504
EP 1990-906167 AW: 19900417
DE 4014395 A1: 19911114
EP 471684 B1: 19931215
G01D0005
German
Patent, Electronic Publication
Fraunhofer IMS ()

Abstract
According to the German patent application, the measurement accuracy and the signal-noise ratio is improved in a circuit and a process for the measurement of a parameter affecting the capacitance-voltage characteristic of a capacitive component so that the parameter is determined from the area below the curve of the capacitance-voltage characteristic, whereby, according to the invention of this additional report, the circuit and the process is used for the measurement of ion concentrations in liquids.

: http://publica.fraunhofer.de/documents/PX-32589.html