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Scattering losses of oxide and fluoride coatings for lasers

: Duparre, A.; Uhlig, H.; Kassam, S.

Guenther, K.H.:
Thin films for optical systems : Tagung 14-18 September 1992, Berlin
Bellingham, Wash.: SPIE, 1993 (Europto series)
ISBN: 0-8194-0961-8
Conference Thin Films for Optical Systems <1992, Berlin>
Conference Paper
Fraunhofer IOF ()
Dünne optische Schicht; dünne Schicht; Lichtstreuung; light scattering; Mikrostruktur; optical thin films; thin film microstructure

Total integrated scattering measurements (- 632.8 nm) and scattering spectroscopy from the VIS to the UV region are used to investigate oxide and fluoride single layers as well as multilayer coatings for laser applications. When examining single films, information on fundamental scattering phenomena can easily be derived. Appropriate substrate-film designs enable volume scattering of the single layer to be separated from interface scattering. So conclusions can be drawn with respect to both roughness correlation properties and film morphology.