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  4. Roughness and defect characterization of optical surfaces by light scattering measurements
 
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1992
Conference Paper
Title

Roughness and defect characterization of optical surfaces by light scattering measurements

Abstract
The microtopography of a certain surface is a complicated structure varying across the complete surface. Every surface has different elements of microstructure. In this paper, we consider roughness as a dine structure and defects as large structure elements. Roughnessmeasurement on BK7-glass and CaF2 samples is considered using different techniques. The comparsion includes the automatic scatterometer STREUIX2 and a TIS-measurement system, the ZYGO microprofilometer MAXIM 3D, and the NANO SCOPE III of Digital Instruments. For the investigation of scattering characteristics of different surface defects, a special measuring device was developed. The scattered light distribution of different defects and contaminations measured with this set-up is discussed.
Author(s)
Truckenbrodt, H.
Duparre, A.
Schuhmann, U.
Mainwork
Thin films for optical systems  
Conference
Conference Thin Films for Optical Systems 1992  
Language
English
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
Keyword(s)
  • Lichtstreuung

  • light scattering

  • Oberflächenrauheit

  • surface roughness

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