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Active probes for 2-port network analysis within 70-230 GHZ

Aktive Meßspitzen für die 2-Tor-Netzwerkanalyse von 70-230 GHz

: Wohlgemuth, O.; Rodwell, M.J.W.; Reuter, R.; Braunstein, J.; Schlechtweg, M.

DOI: 10.1109/MWSYM.1999.780283

	Matloubian, M. ; Institute of Electrical and Electronics Engineers -IEEE-; IEEE Microwave Theory and Techniques Society: IEEE MTT-S International Microwave Symposium Digest 1999. Vol.4 Piscataway, NJ: IEEE, 1999 ISBN: 0-7803-5135-5 ISBN: 0-7803-5136-3 pp.1635-1638 : Ill.
	International Microwave Symposium <1999, Anaheim/Calif.>

	English
	Conference Paper
	Fraunhofer IAF ()
	network analysis; Netzwerkanalyse; S-parameter measurement; S-Parameter-Messung

Abstract
Active probes for 2-port on-wafer network analysis within 70-230 GHz are presented. The probe contains an integrated circuit based on nonlinear transmission lines (NLTL) which has all elements of an S-parameter test set. 2-port measurements with these active probes were carried out. Compared to earlier act probe systems, measurement accuracy is greatly improved.

: http://publica.fraunhofer.de/documents/PX-3191.html