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Raman scattering as a quantitative tool for residual acceptor assessment in semi-insulating GaAs
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1986
Journal Article
Title
Raman scattering as a quantitative tool for residual acceptor assessment in semi-insulating GaAs
Author(s)
Kaufmann, U.
Fraunhofer-Institut für Angewandte Festkörperphysik IAF
Seelewind, H.
Wagner, J.
Journal
Applied Physics Letters
DOI
10.1063/1.96594
Language
English
Fraunhofer-Institut für Angewandte Festkörperphysik IAF
Keyword(s)
Akzeptor
GaAs(semiisolierend)
Ramanstreuung
