Publica
Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten. Quantitative depth profiling of Ti-N-C-O coating materials using MCs+-Sims
| Gillen, G.; Lareau, R.; Bennett, J.; Stevie, F.:
Secondary ion mass spectrometry. SIMS XI. Proceedings of the Eleventh International Conference on Secondary Ion Mass Spectrometry
Chichester: Wiley, 1998
ISBN: 0-471-97826-4
pp.991 |
| International Conference on Secondary Ion Mass Spectrometry (SIMS) <11, 1997, Orlando/Fla.> |
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| English |
| Conference Paper |
| Fraunhofer IST () |