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Precise impedance measurement of dielectric materials under high field intensities by using self-calibration
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1998
Conference Paper
Titel
Precise impedance measurement of dielectric materials under high field intensities by using self-calibration
Author(s)
Liu, J.-G.
Schönecker, A.
Hauptwerk
10th International Symposium on Development in Digital Measuring Instrumentation and 3rd Workshop on ADC Modelling and Testing 1998. Proceedings. Vol.1
Konferenz
International Symposium on Development in Digital Measuring Instrumentation (ISDDMI) 1998
Workshop on ADC Modelling and Testing 1998
Language
English
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Fraunhofer-Institut für Keramische Technologien und Systeme IKTS