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Hier finden Sie wissenschaftliche Publikationen aus den Fraunhofer-Instituten.

Photoluminescence microscopy investigation of lattice defects in epitaxial heterostructures

Photolumineszenz-Mikroskopie-Untersuchungen von Gitter-Defekten in epitaktischen Heterostrukturen
 
: Wang, Z.M.; Baeumler, M.; Jantz, W.; Bachem, K.H.; Larkins, E.C.; Ralston, J.D.

Institute of Electrical and Electronics Engineers -IEEE-:
LEOS '92. Conference Proceedings
New York/N.Y., 1992
pp.319-320 : Abb.,Lit.
IEEE Lasers and Electro-Optics Society (Annual Meeting) <5, 1992, Boston/Mass.>
English
Conference Paper
Fraunhofer IAF ()
MOVPE; photoluminescence microscopy; photoluminescence topography; Photolumineszenz-Spektroskopie; Photolumineszenz-Topographie