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Photo-EPR and spatially resolved EPR of AsBa in as-grown GaAs

 
: Baeumler, M.; Kaufmann, U.; Windscheif, J.

Johnson, N.M. ; Materials Research Society -MRS-:
Microscopic identification of electronic defects in semiconductors. Symposium
Pittsburgh/Pa., 1985 (Materials Research Society symposia proceedings 46)
ISBN: 0-931837-11-1
pp.201-206
Symposium on Microscopic identification of electronic defects in semiconductors <1985, San Francisco/Calif.>
English
Conference Paper
Fraunhofer IAF ()
Antisit; ESR; GaAs

: http://publica.fraunhofer.de/documents/PX-28368.html