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Nondestructive investigation on new materials and electronics by microfocal radiography and high resolution X-ray computed tomography

 
: Maisl, M.; Reiter, H.

WCNDT '89. 12th World Conference on Non-Destructive Testing. Proceedings
Amsterdam, 1989
ISBN: 0-444-87450-X
pp.1667-1672
World Conference on Non-Destructive Testing <12, 1989, Amsterdam>
English
Conference Paper
Fraunhofer IZFP ()
ceramic; computed tomography; electronic; fan beam; high resolution x-ray; microfocal radiography

Abstract
This contribution discusses the microfocal X-ray technique and the high resolution X-ray computed tomography. By the projection technique a direct magnification of structural details is obtained. This paper presents a tomographic unit with a resolution capability in the order of 10 mym. The unit operates with a micro focal X-ray tube as source and two different detection systems. The sample is rotated in the fan beam during the investigation. Results of investigations on ceramics and electronics using micro focal radiography and high resolution X-ray tomography are presented.

: http://publica.fraunhofer.de/documents/PX-26468.html