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Nondestructive characterization of Hg1-xCdxTe layer structures by magneto-thermoelectric measurements.

Zerstörungsfreie Charakterisierung von Hg1-xCdxTe-Schichtstrukturen durch magneto-thermoelektrische Messungen
: Baars, J.; Brink, D.

Longshore, R.E. ; Society of Photo-Optical Instrumentation Engineers -SPIE-, Bellingham/Wash.:
Growth and characterization of materials for infrared detectors : 15-16 July 1993, San Diego, California
Bellingham/Wash.: SPIE, 1993 (SPIE Proceedings Series 2021)
ISBN: 0-8194-1270-8
pp.222-231 : Abb.,Lit.
Conference "Growth and Characterization of Materials for Infrared Detectors" <1993, San Diego/Calif.>
Conference Paper
Fraunhofer IAF ()
doping; Dotierung; HgCdTe; n-p-n structure; n-p-n-Struktur; thermoelectric power; Thermokraft

The thermoelectric properties of n-type Hgsub0.79Cdsub0.21Te (MCT) and of MCT layers with n-p-n structure were invesigated in transverse magnetic fields (B Delta T; 0 equal or smaller than B equal or smaller than 12 kG) using the lateral gradient method at temperatures between 15 K and 300 K. The experimental results were analysed regarding the contributions of electrons and holes to the magneto-thermoelectric effect and the scattering mechanisms involved. The analysis is based on a non-parabolic conduction band and Landau quantization together with expressions for the band gap, the intrinsic carrier density, and the magnetoresistance. The magneto-thermoelectric effect was found to be a useful nondestructive tool for determining the doping and composition of the constituent layers of MCT n-p-n structures.