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New results of field-induced deformation of nematic liquid crystals for testing of digital integrated circuits

	Institute of Electrical and Electronics Engineers -IEEE-, Switzerland Section, Reliability Chapter, Zürich: European Conference on Electron and Optical Beam Testing of Electronic Devices. Conference Preprints Zürich, 1993 pp.9/6-9/9 : Lit.
	European Conference on Electron and Optical Beam Testing of Electronic Devices <4, 1993, Zürich>

	English
	Conference Paper
	Fraunhofer IMS ()
	Auflösungsvermögen; DAP-Effekt; DEBUG-Testmethode; Doppelbrechung; double refraction; ECB-Effekt; electrooptical system; elektrooptisches System; Flüssigkristallbauelement; Funktionsprüfung; integrated circuit; integrierte Schaltung; Mikroskopie; Molekularrotation; optische Anisotropie; optische Drehung; Testen

Abstract
This paper deals with a nematic liquid crystal between line structure and backplate electrode. Experimental results for an optimum spatial resolution including a simple model will be presented providing new preparation method and analysis technique for digital circuits.

: http://publica.fraunhofer.de/documents/PX-26232.html