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  4. New results of field-induced deformation of nematic liquid crystals for testing of digital integrated circuits
 
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1993
Conference Paper
Title

New results of field-induced deformation of nematic liquid crystals for testing of digital integrated circuits

Abstract
This paper deals with a nematic liquid crystal between line structure and backplate electrode. Experimental results for an optimum spatial resolution including a simple model will be presented providing new preparation method and analysis technique for digital circuits.
Author(s)
Wieberneit, M.
Lackmann, R.
Mainwork
European Conference on Electron and Optical Beam Testing of Electronic Devices. Conference Preprints  
Conference
European Conference on Electron and Optical Beam Testing of Electronic Devices 1993  
Language
English
Fraunhofer-Institut für Mikroelektronische Schaltungen und Systeme IMS  
Keyword(s)
  • Auflösungsvermögen

  • DAP-Effekt

  • DEBUG-Testmethode

  • Doppelbrechung

  • double refraction

  • ECB-Effekt

  • electrooptical system

  • elektrooptisches System

  • Flüssigkristallbauelement

  • Funktionsprüfung

  • integrated circuit

  • integrierte Schaltung

  • Mikroskopie

  • Molekularrotation

  • optische Anisotropie

  • optische Drehung

  • Testen

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