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1994
Conference Paper
Titel
A new DSP controlled eddy current system in modular and compact design, some applications on reactor components defect inspection
Abstract
The eddy current (EC) device available now at the IzfP represents the most modern state of the inspection technique, of the electronics and the processor development. Because of the modular concept it's a multipurpose equipment with a wide application field. After a description of the basic concept, the features and the characteristic data of the device three important examples out of the scope ot the inspection of reactor components will be presented.