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Microscopic identification of defects in semiconductors by electron-spin-resonance and related techniques
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1985
Conference Paper
Title
Microscopic identification of defects in semiconductors by electron-spin-resonance and related techniques
Author(s)
Schneider, J.
Mainwork
Microscopic identification of electronic defects in semiconductors. Symposium
Conference
Symposium on Microscopic identification of electronic defects in semiconductors 1985
Language
English
Fraunhofer-Institut für Angewandte Festkörperphysik IAF
Keyword(s)
Defekt(aktiv)
Defekt(elektrisch)
Elektronenspinresonanz
Halbleiter
