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Laser beam testing - fast switches for generation of picosecond electrical pulses.

Laserstrahl-Testverfahren - Schnellschalter zur Erzeugung von elektrischen Pikosekunden-Pulsen
 

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Microelectronic engineering 16 (1992), pp.261-274 : Abb.,Lit.
ISSN: 0167-9317
English
Journal Article
Fraunhofer IAF ()
GaAs; laser beam testing; Laserstrahltestverfahren; Monte Carlo methods; optoelectronic sampling; Optoelektronisches Sampling; photoconductive switching; Photoleitungs-Schalter; picosecond characterization; Pikosekunden-Charakterisierung

Abstract
Laser beam testing of electronic circuits utilizing photoconductive switching and electrooptic sampling gains increasing impact on the development of novel electronic and optoelectronic devices. As an example we discuss picosecond characterization of the response of metal-semiconductor-metal diodes to excitation with femtosecond optical pulses.

: http://publica.fraunhofer.de/documents/PX-21505.html