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  4. Investigation of inhomogenities and impurities in fluoride coatings for high power excimer lasers
 
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1993
Conference Paper
Title

Investigation of inhomogenities and impurities in fluoride coatings for high power excimer lasers

Abstract
In the thickness range 50nm-500nm at substrate temperatures of 300K, 375K, and 575K the structure of physical-vapour-deposited magnesium, lanthanum, calcium, and lithium fluoride films were investigated using TEM microfractographical replication technique. Two growth groups, columnar and granular growth, were found and main structure buildings elements with its characteristical medium size have been determined. Using SIMS, SNMS, RBS, and partially spectroscopical and gravimetrical measurements, the O and C contamination of the films has been investigated. The quantitative results were related to the characteristical structure building elements.
Author(s)
Kaiser, N.
Kaiser, U.
Weißbrodt, P.
Mademann, D.
Hacker, E.
Mainwork
Thin films for optical systems  
Conference
Conference Thin Films for Optical Systems 1992  
Language
English
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
Keyword(s)
  • Dünne optische Schicht

  • excimer laser optics

  • Excimer-Laser-Optik

  • fluoride thin films

  • Fluoridschicht

  • laser induced damage threshold

  • Laserzerstörschwelle

  • optical coating

  • optical thin films

  • oxide thin films

  • Oxidschicht

  • ultraviolet spectral region

  • ultravioletter Spektralbereich

  • UV

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