• English
  • Deutsch
  • Log In
    Password Login
    Research Outputs
    Fundings & Projects
    Researchers
    Institutes
    Statistics
Repository logo
Fraunhofer-Gesellschaft
  1. Home
  2. Fraunhofer-Gesellschaft
  3. Konferenzschrift
  4. Interface and volume inhomogenities in optical thin films investigated by light scattering methods
 
  • Details
  • Full
Options
1994
Conference Paper
Title

Interface and volume inhomogenities in optical thin films investigated by light scattering methods

Abstract
A theoretical formalism and experimental methods are presented, which enable statistical fluctuations of the film bulk and interface roughness properties to be estimated from volume scattering and roughness scattering, respectively. The theoretical model is implemented in a numerical algorithm that allows to optimize experimental strategies and to determine morphological parameters from measured scattering curves. Angle resolved scattering (ARS) measurements are performed on MgF2 films on glass substrates while varying the illumination and observation parameters. Atomic force microscopy (AFM) provides helpful additional information on the surface morphology.
Author(s)
Duparre, A.
Gliech, S.
Hehl, K.
Pichlmaier, U.
Schuhmann, U.
Mainwork
Optical Interference Coatings  
Conference
International Symposium on Optical Interference Coatings 1994  
Language
English
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
Keyword(s)
  • dünne Schicht

  • Lichtstreuung

  • light scattering

  • Mikrostruktur

  • Oberflächenrauheit

  • surface roughness

  • thin film microstructure

  • Cookie settings
  • Imprint
  • Privacy policy
  • Api
  • Contact
© 2024