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1992
Journal Article
Titel
Input voltage sensitivity of GaAs/GaAlAs HEMT latched comparator
Abstract
The input voltage sensitivity represents a critical parameter for a latched comparator in high-speed and high-precision data conversion applications. An analytical prediction of this parameter is presented and it has been verified to be in good agreement with the experimental results from a high performance latched comparator implemented in 0.5 mu m GaAs/GaAlAs E/D HEMT technology.