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  4. High-Resolution NDT-Methods for the Characterization of Surfaces and Layered Structures
 
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1997
Conference Paper
Title

High-Resolution NDT-Methods for the Characterization of Surfaces and Layered Structures

Abstract
The paper provides a survey of important non-destructive methods for the characterization of surfaces and layered structures and gives examples for the measurement of the layer thickness, adhesion and the determination of magnetic, electric, thermal of elastic characteristics with high resolution.
Author(s)
Altpeter, I.
Fassbender, S.
Meyendorf, N.
Netzelmann, U.
Mainwork
Materials, functionality & design. Proceedings of the 5th European Conference on Advanced Materials and Processes and Applications. Vol. 4: Characterization and production/design  
Conference
European Conference on Advanced Materials and Processes and Applications (EUROMAT) 1997  
Language
English
Fraunhofer-Institut für Zerstörungsfreie Prüfverfahren IZFP  
Keyword(s)
  • crystallographic structure

  • nanocrystalline

  • resistivity

  • scanning force microscopy

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