Growth of Sn thin films on CdTe(111)

Zimmermann, H.; Keller, R.C.; Meisen, P.; Seelmann Eggebert, M.

doi:10.1016/S0039-6028(96)01519-1

1997

Journal Article

Abstract

The formation and the growth of Sn films on CdTe(111) have been studied by hemispherically recorded ARXPS. The XPD patterns show that these films consist of alpha-Sn. XPD and ARXPS depth profile analysis reveal the presence of an intermixing zone at the interface which establishes during the initial stages of film formation.

Author(s)

Zimmermann, H.

Keller, R.C.

Meisen, P.

Seelmann Eggebert, M.

Journal

Surface Science

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Growth of Sn thin films on CdTe(111)