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Growth of Sn thin films on CdTe(111)

Wachstum dünner Zinnschichten auf CdTe(111)

: Zimmermann, H.; Keller, R.C.; Meisen, P.; Seelmann Eggebert, M.

	Surface Science 377-379 (1997), pp.904-908 : Ill., Lit. ISSN: 0039-6028

	English
	Journal Article
	Fraunhofer IAF ()
	Alpha-Sn; ARXPS; CdTe; contact; Kontakt; XPD

Abstract
The formation and the growth of Sn films on CdTe(111) have been studied by hemispherically recorded ARXPS. The XPD patterns show that these films consist of alpha-Sn. XPD and ARXPS depth profile analysis reveal the presence of an intermixing zone at the interface which establishes during the initial stages of film formation.

: http://publica.fraunhofer.de/documents/PX-16456.html