Global standardization of compound semiconductor test methods

The present international status of standardization for compound semiconductor materials is reviewed. A limited number of standard specifications and standard test methods have been issued or are under preparation. Two of them, standardizing the measurement of carbon in GaAs and the resistivity of semi-insulating material, are discussed in detail. The results of an inquiry on the demand for new standards are reported and a general strategy to improve international cooperation with respect to the elaboration and general acceptance of standards is outlined.