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Fourier transform photoluminescence excitation spectroscopy of medium-bandgap Hg1-xCdxTe and InSb.

Fourier-Transform-Photolumineszenz- Anregungsspektroskopie und Hg1-xCdxTe mit mittlerem Bandabstand und an InSb
 
: Fuchs, F.; Kheng, K.; Schwarz, K.; Koidl, P.

:

Semiconductor Science and Technology 8 (1993), pp.S75-S80
ISSN: 0268-1242
ISSN: 1361-6641
English
Journal Article
Fraunhofer IAF ()
Fourier spectroscopy; Fourier-Spektroskopie; Hg1-xCdxTe; InSb; PLE

Abstract
We report for the first time on Fourier transform photoluminescence excitation spectroscopy in the mid-infrared covering the wavelength range between 1 and 5.5 Mym. By studying a medium-bandgap Hgsub0.66Cdsub0.34Te bulk crystal and InSb bulk material, direct evidence for the excitonic nature of the luminescence transitions has been found in both cases. In addition, the excitation spectra on MBE-grown Hgsub1minusxCdsubxTe superlattices show the step-like density of states of the confined two- dimensional system.

: http://publica.fraunhofer.de/documents/PX-15156.html