• English
  • Deutsch
  • Log In
    Password Login
    Research Outputs
    Fundings & Projects
    Researchers
    Institutes
    Statistics
Repository logo
Fraunhofer-Gesellschaft
  1. Home
  2. Fraunhofer-Gesellschaft
  3. Artikel
  4. Evaluation of thin MgF2 films by spectroscopic ellipsometry
 
  • Details
  • Full
Options
1993
Journal Article
Title

Evaluation of thin MgF2 films by spectroscopic ellipsometry

Abstract
In this paper we have focused on the investigation of the structure of MgF2 thin films. Spectroscopic ellipsometry (SE) (SOPRA) has been used to evaluate optical inhomogenities, namely the depth-distribution of water-filled voids and the dispersion of the refractive index in the 250-900 mm vavelength region. The SE data regression analysis was supported by transmission electron microscopy (TEM) structure models and confirmed by SIMS.
Author(s)
Kaiser, N.
Zuber, A.
Kaiser, U.
Journal
Thin solid films  
DOI
10.1016/0040-6090(93)90754-D
Language
English
Fraunhofer-Institut für Angewandte Optik und Feinmechanik IOF  
Keyword(s)
  • optical thin films

  • spectroscopic ellipsometry

  • Cookie settings
  • Imprint
  • Privacy policy
  • Api
  • Contact
© 2024