• English
  • Deutsch
  • Log In
    Password Login
    Research Outputs
    Fundings & Projects
    Researchers
    Institutes
    Statistics
Repository logo
Fraunhofer-Gesellschaft
  1. Home
  2. Fraunhofer-Gesellschaft
  3. Artikel
  4. Electron parametric resonance identification of the SbGa heteroantisite defect in GaAs:Sb
 
  • Details
  • Full
Options
1989
Journal Article
Title

Electron parametric resonance identification of the SbGa heteroantisite defect in GaAs:Sb

Other Title
Identifizierung des SbGa Hetero-Antisite Defektes in GaAs/Sb mittels ESR
Abstract
GaAs doped with antimony (Sb) to a level of 10 high 19 cm high minus 3 has been studied by electron paramagnetic resoncance (EPR). A new EPR spectrum has been discovered which is identified as the Sb sub Ga heteroantisite defect. The electronic structure of this defect is practically indentical whith that of the intrinsic-anion antisite devects in GaP, GaAs, and InP. The EPR results show that Sb can be incorporated as an electrically active defect and therefore is not a suitable isovalent dopant in the growth of low-dislocation-density semi-insulating GaAs.
Author(s)
Baeumler, Martina  
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Schneider, J.
Mitchel, W.C.
Yu, P.W.
Kaufmann, U.
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Journal
Physical Review. B  
DOI
10.1103/PhysRevB.39.6253
Language
English
Fraunhofer-Institut für Angewandte Festkörperphysik IAF  
Keyword(s)
  • ESR

  • Hetero-Antisite Defekt

  • isovalente Dotierung

  • räumliche Homogenität

  • SbGa

  • si-GaAs

  • Cookie settings
  • Imprint
  • Privacy policy
  • Api
  • Contact
© 2024