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Einbindung in das informationstechnische Umfeld. Herausforderung für die technische Diagnostik

 
: Guckenbiehl, T.

TU Dresden:
4. Kolloquium Technische Diagnostik 1996. Tagungsband
Dresden: TU, 1996
pp.314-320
Kolloquium Technische Diagnostik <4, 1996, Dresden>
German
Conference Paper
Fraunhofer IITB ( IOSB) ()
CIM; distributed diagnosis; technical diagnosis; technische Diagnose; verteilte Diagnose

Abstract
A growing number of technical systems, from automobiles to intelligent manufacturing systems, integrates complex components of different manufacturers with local functions for monitoring and diagnosis. This article wants to point out the difficulties in providing access to these functions for the control system or the operators of the overall system. Finally it discusses some ways to face this challenge.

: http://publica.fraunhofer.de/documents/PX-10825.html