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X-ray absorption fine structure study of short-range order of iron in Fe/Al multilayers

 
: Meyer, D.C.; Richter, K.; Paufler, P.; Gawlitza, P.; Holz, T.

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Journal of applied physics 87 (2000), No.10, pp.7218-7226
ISSN: 0021-8979
ISSN: 1089-7550
English
Journal Article
Fraunhofer IWS ()
Struktur; Multischicht; Nanomaterialien; Grenzfläche; Nanotechnologie; PLD; nm-Präzisionsschicht

Abstract
Results of quantitative analysis of fluorescence x-ray absorption fine structure (XAFS) experiments at the FeK absorption edge are presented for a 6*(4.3 nm Fe/10.4 nm Al) multilayer prepared by pulsed laser deposition. Fluorescence XAFS experiments have been combined with excitation of prepared by pulsed laser deposition. Fluorescence XAFS experiments have been combined with excitation of x-ray standing waves. This combination in one experiment allowed for a depth-controlled excitation of Fe fluorescence and hence for a depth-resolved analysis of short-range order. Depth-resolved analysis showed that instead of sharp Fe/Al or Al/Fe interfaces extended interlayer regions exist. The structure retained that of bulk a-Fe. In the upper half of the Fe layer 37 at. % Al as nearest and next nearest neighbors of Fe were found, whereas in the lower half 80 at. % Al atoms occur. Thus the Fe/Al interface (deposition of Fe on Al)should be characterized by an intermixing zone significantly larger in comparison to that of the Al/Fe interface (deposition of Al on Fe).By conventional XAFS measurement carried out at a fixed angle of incidence of the exciting beam an average Fe neighborhood for the entire Fe layer of 58 at. % Al atoms was found. This value agrees with the average obtained when the analysis of the layer was performed separately for two sublayers by shifting the wave field through the layer.

: http://publica.fraunhofer.de/documents/N-993.html