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MoTeF - A toolchain for modelbased test generation

Presentation held at the Embedded World Conference, Nuremberg, 05. March 2009
 
: Heidrich, M.

:
Fulltext urn:nbn:de:0011-n-955598 (669 KByte PDF)
MD5 Fingerprint: c93eceb2cd6ef2f4311346dc053f3e8f
Created on: 9.6.2009


Nuremberg, 2009, 25 Folien
Embedded World Conference <2009, Nürnberg>
English
Presentation, Electronic Publication
Fraunhofer ESK ( IKS) ()

Abstract
During the last decade the model-based generation of test cases has become more and more popular. This circumstance was caused by many different reasons. The most important fact is that manual creation of test cases is time consuming and error prone. Nowadays, many different academics as well as comercial solutions for the model based test generation exist. In this publication a new concept for a generic tollchain for the automated test case generation and test case selection is presented.

: http://publica.fraunhofer.de/documents/N-95559.html