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  4. MoTeF - A toolchain for modelbased test generation
 
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2009
Presentation
Title

MoTeF - A toolchain for modelbased test generation

Title Supplement
Presentation held at the Embedded World Conference, Nuremberg, 05. March 2009
Abstract
During the last decade the model-based generation of test cases has become more and more popular. This circumstance was caused by many different reasons. The most important fact is that manual creation of test cases is time consuming and error prone. Nowadays, many different academics as well as comercial solutions for the model based test generation exist. In this publication a new concept for a generic tollchain for the automated test case generation and test case selection is presented.
Author(s)
Heidrich, M.
Fraunhofer-Institut für Eingebettete Systeme und Kommunikationstechnik ESK  
Publishing Place
Nuremberg
Conference
Embedded World Conference 2009  
File(s)
Download (668.78 KB)
Rights
Use according to copyright law
DOI
10.24406/publica-fhg-362050
Language
English
ESK  
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