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Technology trends of microlens imprint lithography and wafer level cameras (WLC)

 
: Völkel, R.; Duparré, J.; Wippermann, F.; Dannberg, P.; Bräuer, A.; Zoberbier, R.; Gabriel, M.; Hornung, M.; Hansen, S.; Süss, R.

Thienpont, H. ; Japan Society of Applied Physics -JSAP-:
Technical digest of the Fourteenth Microoptics Conference : September 25 - 27, 2008, Diamant Conference and Business Centre, Brussels - Belgium
Tokyo: The Microoptics Group, 2008
pp.312-315
Microoptics Conference (MOC) <14, 2008, Brussels>
English
Conference Paper
Fraunhofer IOF ()

: http://publica.fraunhofer.de/documents/N-93742.html