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DC-arc behavior of a novel active fuse

 
: Dorp, J. vom; Berberich, S.E.; Bauer, A.J.; Ryssel, H.

:

Institute of Electrical and Electronics Engineers -IEEE-:
ESSDERC 2008, 38th European Solid-State Device Research Conference. Proceedings : Edinburgh, UK, 15-19 September 2008
New York, NY: IEEE, 2008
ISBN: 978-1-4244-2363-7
pp.67-70
European Solid State Device Research Conference (ESSDERC) <38, 2008, Edinburgh>
English
Conference Paper
Fraunhofer IISB ()
electric fuse; power electronics; reliability

Abstract
In this work, new results on an active fuse which is a novel power device to prevent serious hazards in power electronics in the case of a malfunction are presented. The focus of this work is on the characterization of the ldquocutout-bridgerdquo in terms of functionality and reliability. Different cutout-bridge geometries and the dc-arc behavior during fuse release is analyzed and by utilizing an additional snubber circuit to minimize the dc-arc behavior, the release time of the fuse was reduced significantly.

: http://publica.fraunhofer.de/documents/N-93166.html