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Comparison of the high power microwave and ultra wide band susceptibility of modern microprocessor boards

 
: Nitsch, D.; Sabath, F.; Schmidt, H.U.; Braun, C.

Meyer, G. ; Institut für Kommunikationstechnik -IKT-, Zürich; Institut für Feldtheorie und Höchstfrequenztechnik -IFH-, Zürich:
Electromagnetic compatibility 2003 : 15th International Zurich Symposium and Technical Exhibition on Electromagnetic Compatibility, February 18 - 20, 2003
Zürich: ETH Zentrum - IKT, 2003
ISBN: 3-9521199-7-0
pp.121-126
International Zurich Symposium and Technical Exhibition on Electromagnetic Compatibility (EMC) <15, 2003, Zürich>
English
Conference Paper
Fraunhofer INT ()

Abstract
The large importance of modern microelectronics for our society makes the investigation of their susceptibility to electromagnetic threats like High Power Microwaves (HPM) and ultra wide band pulses (UWB) a very important topic. Particularly the susceptibility of microprocessor boards to those electromagnetic threats was thoroughly examined in different test facilities. The understanding of the basic common and different effects of these two classes of electromagnetic threat pulses is of large interest.
In this paper the advantages and the disadvantages of HPM and UWB pulses are examined based on susceptibility
tests of two different microprocessor boards in five different test facilities. The measured data is presented and discussed by using time- and frequency domain quantities, the average spectral amplitude and the energy- and amplitude efficiency.

: http://publica.fraunhofer.de/documents/N-88533.html