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Surface acoustic waves go under the microscope

: Arnold, W.

Physics world 14 (2001), pp.25-26
ISSN: 0953-8585
Journal Article
Fraunhofer IZFP ()
acoustic surface wave; high resolution; surface characterization; microscope

Surface acoustic waves with slightly different frequencies are launched from transducers towards the tip of an atomic force microscope. The tip vibrates at a frequency given by the difference between the two waves. The vibrations are measured by monitoring the light reflected from the cantilever onto the photodiode.