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Characterization of interface state densities by photocurrent analysis. Comparison of results for different insulator layers

Poster at INFOS05 - 14th Biennial Conference on Insulating Films on Semiconductors, Leuven, Belgium
 
: Rommel, M.; Groß, M.; Ettinger, A.; Bauer, A.J.; Frey, L.; Ryssel, H.

:
Fulltext urn:nbn:de:0011-n-832113 (1.8 MByte PDF)
MD5 Fingerprint: 5e244d752b8bae1270e0522ce8445250
Created on: 5.11.2008


2005, 1 Folie
Conference on Insulating Films on Semiconductors (INFOS) <14, 2005, Leuven>
English
Poster, Electronic Publication
Fraunhofer IISB ()
interface state density; interface recombination velocity; injection level dependent interface recombination; interface recombination modeling; carrier lifetime; electrostatic passivation

: http://publica.fraunhofer.de/documents/N-83211.html